Papers by Author: Nobuyasu Mizutani

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Authors: Takanori Kiguchi, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani
237
Authors: Takanori Kiguchi, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani
203
Authors: Daisuke Nagano, Mitsunori Sugiura, Naoki Wakiya, Hiroshi Funakubo, Kazuo Shinozaki, Nobuyasu Mizutani
87
Authors: N. Nukaga, Ishikawa Kunio, Kazuo Shinozaki, Nobuyasu Mizutani, Hiroshi Funakubo
145
Authors: Naoki Wakiya, Akinori Higuchi, Haruki Ryoken, Hajime Haneda, Keiichi Fukunaga, Noriyoshi Shibata, Toshimasa Suzuki, Yuji Nishi, Kazuo Shinozaki, Nobuyasu Mizutani
Abstract: Diffusion behavior at the interface of (001)-epitaxially grown (Ba,Sr)TiO3(BST)/electrode/buffer layer/Si thin films was examined by use of secondary ion-microprobe mass spectrometer (SIMS) and transmission electron microscope (TEM) attached with energy dispersive X-ray fluorescence spectrometer (EDX). As the (001)-epitaxially grown film, following three kinds of structure was grown; (1)BST/(La,Sr)CoO3(LSCO)/CeO2/yttria-stabilized zirconia(YSZ)/Si, (2)BST/PLD-deposited Pt/SrTiO3(ST)/LSCO/CeO2/YSZ/Si and (3)BST/sputter-deposited Pt/ST/LSCO/CeO2/YSZ/Si. For sample (1), uphill diffusion of Sr and Ti was observed at the interface of YSZ and SiO2. Diffusion of Co into CeO2 layer was also detected. These tendencies of diffusion were also observed for samples (2) and (3). In addition to these tendencies, apparent uphill diffusion of Co at the Pt layer was observed for sample (2). However, this diffusion was not observed for sample (3). It was also observed that oxygen diffusion was prevented for sputter-deposited Pt. On the other hand, oxygen diffusion was observed for PLD-deposited Pt.
257
Authors: Hiroshi Funakubo, M. Yonetsu, Kazuo Shinozaki, Nobuyasu Mizutani, M. Ishikawa, Naoya Sakai, Harumi Yokokawa
175
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