Papers by Keyword: Extended Defects

Paper TitlePage

Authors: Simona Binetti, Alessia Le Donne, Maurizio Acciarri, M. Cerminara, Sergio Pizzini
317
Authors: M. Kaniewska, J. Kaniewski, Anthony R. Peaker
1511
Authors: N. Vouroutzis, Mikael Syväjärvi, J. Stoemenos, Rositza Yakimova
277
Authors: Nadeemullah A. Mahadik, Robert E. Stahlbush, Joshua D. Caldwell, Michael J. O'Loughlin, Albert A. Burk

Abstract: The effect of extended defects on carrier lifetime was investigated in 140 um thick 4H-SiC epilayers using whole wafer ultraviolet...

297
Authors: Nina Khuchua, Marina Tigishvili, Revaz Melkadze, Nugzar Dolidze, Nodar Gapishvili, Zurab Jibuti, Galina Davbeshko, V. Romanyuk

Abstract: For specific modification of the fundamental optical and photoelectrical properties of silicon transparent for wavelengths beyond 1.1μm,...

374
Authors: Kendrick X. Liu, X. Zhang, Robert E. Stahlbush, Marek Skowronski, Joshua D. Caldwell

Abstract: Material defects such as Si-core and C-core partial dislocations (PDs) and threading screw dislocations (TSDs) and threading edge...

345
Authors: Y. Zaitsu, K. Osada, T. Shimizu, Satoshi Matsumoto, M. Yoshida, Eisuke Arai, Takeji Abe
1891
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