Papers by Keyword: Hole Traps

Paper TitlePage

Authors: Patrick Fiorenza, Filippo Giannazzo, Alessia Frazzetto, Alfio Guarnera, Mario Saggio, Fabrizio Roccaforte

Abstract: This paper reports on the conduction mechanisms through the gate oxide and trapping effects at SiO2/4H-SiC interfaces in...

705
Authors: Yoshihito Katsu, Takuji Hosoi, Yuichiro Nanen, Tsunenobu Kimoto, Takayoshi Shimura, Heiji Watanabe

Abstract: We evaluated the effect of NO annealing on hole trapping characteristic of SiC metal-oxide-semiconductor (MOS) capacitor by measuring...

599
Authors: S. Scharf, M. Schmidt, D. Bräunig
91
Authors: L. Storasta, F.H.C. Carlsson, S.G. Sridhara, Boleslaw Formanek, Peder Bergman, Anders Hallén, Erik Janzén
431
Showing 1 to 6 of 6 Paper Titles