Papers by Keyword: Hole Traps

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Authors: Patrick Fiorenza, Filippo Giannazzo, Alessia Frazzetto, Alfio Guarnera, Mario Saggio, Fabrizio Roccaforte

Abstract: This paper reports on the conduction mechanisms through the gate oxide and trapping effects at SiO2/4H-SiC interfaces in...

Authors: Yoshihito Katsu, Takuji Hosoi, Yuichiro Nanen, Tsunenobu Kimoto, Takayoshi Shimura, Heiji Watanabe

Abstract: We evaluated the effect of NO annealing on hole trapping characteristic of SiC metal-oxide-semiconductor (MOS) capacitor by measuring...

Authors: S. Scharf, M. Schmidt, D. Bräunig
Authors: L. Storasta, F.H.C. Carlsson, S.G. Sridhara, Boleslaw Formanek, Peder Bergman, Anders Hallén, Erik Janzén
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