Papers by Keyword: Line Profile Analysis

Paper TitlePage

Authors: Iuliana C. Dragomir, András Borbély, Tamás Ungár
Abstract: Anisotropic strain broadening of diffraction peaks can be parameterised by dislocation contrast factors. A comprehensive software has been developed and made available through the internet to determine the individual and averaged contrast factors which are also compiled for cubic and hexagonal crystals. Using the theoretical and the measured values of contrast factor the microstructure of the specimen can be characterised in terms of active slip systems, Burgers vector populations, dislocation densities and crystallite size- and size distribution.
95
Authors: I. Lucks, P. Lamparter, Eric J. Mittemeijer
451
Authors: W.I.F. David, Matteo Leoni, Paolo Scardi
Abstract: The implementation of a physically-sound size broadening model for peak profiles in the Rietveld method is presented. TOPAS macros are provided and the results compared with analogous modelling performed according to advanced analysis methods such as the Whole Powder Pattern Modelling.
187
Authors: Paolo Scardi, Matteo Leoni, Mirco D'Incau
Abstract: The recent evolution of powder diffraction line profile analysis toward full pattern methods is discussed. Specific reference is made to the Whole Powder Pattern Modelling (WPPM), as applied to metals and ceramics subjected to strong plastic deformation. Examples concerning three different materials science studies are shown to illustrate features and potentialities of the WPPM approach.
27
Authors: Arnold C. Vermeulen, Rob Delhez
Abstract: All methods of analyzing the broadening of XRD line profiles have to take into account two basic effects: broadening by the instrument - including the X-ray spectrum - and the characteristics of broadening by size effects and by lattice defects - including their interaction. These effects are handled in practice by a wide range of auxiliary assumptions. In this paper these assumptions and their quality with respect to "appropriateness of purpose" are listed and compared. By systematic ranking of these assumptions in accordance with their quality, a 2-dimensional map can be constructed that visualizes the differences in the quality of the assumptions. This 2-dimensional map brings a new viewpoint to the various methods for line profile analysis, because it enables a qualitative comparison of the assumptions of existing methods and new developments.
127
Authors: Paolo Scardi, Yu Hui Dong, Matteo Leoni
132
Authors: B.A. Marinković, Z. Žakula, S. Đurić, N. Nikolić, O. Milošević, Momcilo M. Ristić
1068
Authors: Z. Somogyvári, E. Sváb, Gy. Mészáros, Kiril Krezhov, P. Konstantinov, Tamás Ungár, Jenő Gubicza
771
Showing 1 to 10 of 27 Paper Titles