Papers by Keyword: Area Detector

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Authors: Toshihiko Sasaki
Abstract: In order to study the method of the neutron stress measurement using the cosα method, a numerical simulation study was performed and the result was compared with author's former experiment. The results of the simulation study agreed with those obtained in the previous experiment, which suggests the validity of the present method for neutron stress measurement.
Authors: Kenji Suzuki, Takahisa Shobu, Ayumi Shiro, Hidenori Toyokawa
Abstract: The rotating-slit system was developed to overcome the measurement of internal stress using 2-dimensional detector. The diffraction spot trace method was proposed and examined to measure the internal stress of the material with coarse grains.
Authors: Yohei Miyazawa, Osama Yaguchi, Toshihiko Sasaki
Abstract: In this study, the authors investigated the application of the area detector type method for the purpose of evaluating residual stress in tools having a V-groove. The specimen used was a shot-peened forming rack. This alternative method uses a diffraction ring and single incidence X-ray to clarify precisely and effectively complex stresses and stresses in narrow parts of the tools such as the teeth on the surface of the rack. In addition, the authors evaluated stress gradients generated after shot peening using synchrotron radiation (SR).
Authors: Bob B. He, Kingsley L. Smith, Uwe Preckwinkel, Willard schultz
Authors: Toshihiko Sasaki, Shunichi Takahashi, Yuichi Kobayashi, Yukio Morii, Naoto Metoki
Abstract: The influence of the peak determination method on the area detector type neutron stress measurement method was investigated. Two peak determination methods, the half value breadth method and the centroid method, were compared and discussed in this paper. Experiments and simulation studies were carried out respectively. The first experiment was conducted during the tensile stress test with a steel specimen having the thickness of 6mm, and the second experiment was conducted with steel specimens in the stress free state having the thickness between 1 mm to 20 mm. As a result of the experiments, it was found that the peak determination method has an affect on the area detector type neutron stress measurement. A numerical simulation study was also conducted and showed similar result as the experiments.
Authors: Leng Chen, Wei Min Mao, H.P. Feng, Yong Ning Yu
Authors: Bob B. He, Kingsley L. Smith, Uwe Preckwinkel, Willard schultz
Authors: Bob B. He
Abstract: Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.
Authors: Bob B. He
Abstract: The two most important advances in two-dimensional x-ray diffraction (XRD2) are area detectors for collecting 2D diffraction patterns and algorithms in analyzing 2D diffraction patterns. The VÅNTEC-500 area detector represents the innovation in detector technology. The combination of its large active area, high sensitivity, high count rate, high resolution and low noise, makes it the technology of choice for many applications, including texture analysis. A 2D diffraction pattern contains information in a large solid angle which can be described by the diffraction intensity distribution in both 2θ and g directions. The texture information appears in a 2D diffraction pattern as intensity variation in g direction. The intensity variation represents the orientation distribution of the crystallites in a polycrystalline material. The diffraction vector orientation regarding to the sample orientation can be obtained by vector transformation from the laboratory space to the sample space. The fundamental equations for texture analysis are derived from the unit vector expression in the sample space.
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