Papers by Keyword: Atomic Force Microscope (AFM)

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Authors: Bo Wen Zhang, Yong Da Yan, Zhen Jiang Hu, Xue Sen Zhao, Ying Chun Liang, Wei Dong Fei, Shen Dong
Abstract: As the dimensions of parts become smaller, understanding the mechanical properties of these small components was becoming more important. Till present day, the methods and technology used to investigate the deformation behavior in nanoscale were still lacking. In this paper, the specimens were single crystal copper wires with diameter in 50 microns. Atomic force microscope integrated with an in- situ tensile system were used to determine the mechanical behavior of copper wires and observe the surface topography deformation in nanoscale simultaneously. The results were as follows: the modulus of elasticity, tensile strength and failure strain of the sample were 167Gpa, 0.564GPa and 0.011, respectively. By using AFM, the separation process between the copper wire and impurities on it, such as oxide film, was observed. The nanoscale deformation process of the copper wire was also obtained.
Authors: P. Dupel, Thierry Chassagne, Didier Chaussende, Yves Monteil, François Cauwet, Etienne Bustarret, A. Deneuville, G. Bentoumi, Eugénie Martinez, B. Daudin, G. Feuillet
Authors: Yoshikazu Arai, T. Asai, Sayeda Ferdous, Wei Gao
Abstract: This paper describes an atomic force microscope (AFM) based instrument for 3D edge profile measurement of single-point diamond cutting tools. The instrument is composed of an AFM unit and an optical sensor for alignment of the AFM probe tip (silicon cantilever) with the diamond cutting tool edge. In the optical sensor, a laser beam from a laser diode along the Y-axis is focused to generate a small beam spot with a micrometer-order diameter at the beam waist, and then received by a photo-detector (photodiode). The tool edge top and the AFM probe tip are brought to the center of the beam waist in the XZ-plane through monitoring the variation of the photodiode output, respectively. Consequently, the AFM tip can be aligned with the tool edge top. Alignment experiments and 3D edge profile measurements of a round-nose type single-point diamond tool are carried out.
Authors: Takashi Aigo, M. Sawamura, Tatsuo Fujimoto, Masakazu Katsuno, Hirokatsu Yashiro, Hiroshi Tsuge, Masashi Nakabayashi, Taizo Hoshino, Noboru Ohtani
Abstract: 4H-SiC epitaxial layers on Carbon-face (C-face) substrates were grown by a low-pressure hot-wall type chemical vapor deposition system. The C-face substrates were prepared by fine mechanical polishing using diamond abrasives with the grit size of 0.25 %m and in-situ HCl etching at 1400°C, which produced surface roughness of 0.27 nm. The use of the smooth substrates made it possible to decrease the substrate temperature and specular surface morphologies were realized at C/Si ratios of 1.5 or less both for a substrate temperature of 1550°C and for that of 1500°C. Surface roughness of 0.26 nm and the residual donor concentration of 6.7×1014 cm-3 were obtained for a C-face epitaxial layer grown at a C/Si ratio of 1.5 and at a substrate temperature of 1550°C. Schottky barrier diodes were fabricated on a non-doped C-face epitaxial layer grown at 1500°C and it was verified that a high quality metal-semiconductor interface was formed on the epitaxial layer.
Authors: Jawad ul Hassan, Peder Bergman, Anne Henry, Henrik Pedersen, Patrick J. McNally, Erik Janzén
Abstract: We report on the growth of 4H-SiC epitaxial layer on Si-face polished nominally on-axis 2” full wafer, using Hot-Wall CVD epitaxy. The polytype stability has been maintained over the larger part of the wafer, but 3C inclusions have not been possible to avoid. Special attention has given to the mechanism of generation and propagation of 3C polytype in 4H-SiC epilayer. Different optical and structural techniques were used to characterize the material and to understand the growth mechanisms. It was found that all 3C inclusions were generated at the interface between the substrate and the epitaxial layer, and no 3C inclusions were initiated at later stages of the growth.
Authors: Frédéric Lanois, Dominique Planson, P. Lassagne, Christophe Raynaud, Edwige Bano
Authors: Joydip Sengupta, Sovan Kumar Panda, Chacko Jacob
Abstract: The effect of Fe and Ni catalysts on the synthesis of carbon nanotubes (CNTs) using atmospheric pressure chemical vapor deposition (APCVD) was investigated. Distribution of the catalyst particles over the Si substrate was analyzed by atomic force microscopy (AFM). Characterization by X-ray diffraction analysis (XRD), field emission scanning electron microscopy (FESEM), high-resolution transmission electron microscopy (HRTEM) and Raman spectroscopic measurements over the grown species is reported. The study clearly shows that the catalyst strongly influences morphology and microstructure of the grown CNTs.
Authors: Christopher L. Frewin, Camilla Coletti, Christian Riedl, Ulrich Starke, Stephen E. Saddow
Abstract: A comprehensive study on the hydrogen etching of numerous SiC polytype surfaces and orientations has been performed in a hot wall CVD reactor under both atmospheric and low pressure conditions. The polytypes studied were 4H and 6H-SiC as well as 3C-SiC grown on Si substrates. For the hexagonal polytypes the wafer surface orientation was both on- and off-axis, i.e. C and Si face. The investigation includes the influence of the prior surface polishing method on the required etching process parameters. 3C-SiC was also studied grown in both the (100) and (111) orientations. After etching, the samples were analyzed via atomic force microscopy (AFM) to determine the surface morphology and the height of the steps formed. For all cases the process conditions necessary to realize a well-ordered surface consisting of unit cell and sub-unit cell height steps were determined. The results of these experiments are summarized and samples of the corresponding AFM analysis presented.
Authors: Mariana Prodana, R. Luca, Florin Miculescu, D. Bojin
Abstract: . The aim of this paper is to evaluate surface properties of natural temporary teeth from high polluted area by dynamics of balance hydrophil hydrophob in connection with surface analysis type atomic force microscopy (AFM). All the data were discussed in relation with the state of degradation of such teeth, taking into account that teeth are biological archive.
Authors: J. Schäfer, Johannes Sitterberg, C. Ehrhardt, M.N.V. Ravi Kumar, Udo Bakowsky
Abstract: The preparation and charactersiation of novel lipid coated PLGA nanoparticles was investigated in the presented study. The size of the pure nanoparticles could be adjusted in dependence on the stabilizer content. The supported lipid bilayer surrounding the nanoparticles was formed by the liposome spreading technique. The Lipid- coated nanoparticles were characterised using Photon Correlation Spectroscopy (PCS) and atomic force microscopy (AFM) investigations. The bioadhesive properties was proofed in a cell culture model.
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