Papers by Keyword: High Resolution Electron Microscopy

Paper TitlePage

Authors: Alexander A. Tonkikh, Victor Tapio Rangel-Kuoppa, Nikolay D. Zakharov, Wolfgang Jantsch, Peter Werner
Abstract: We report on a specific defect, which may form during the growth of Stranski-Krastanov surfactant-mediated Ge/Si (100) islands. Transmission electron microscopy reveals that these loop-like defects are local and could be represented by a missing plane of Ge atoms inside some of Ge islands. This specific defect may generate an electrically active trap within the Si band gap at about 0.3 eV above the Si valence band edge. Deep level transient spectroscopy reveals that at least 1 % of Ge islands may include such defects.
Authors: Dmitriy A. Petrov, Irina S. Edelman, Ruslan D. Ivantsov, Sergey M. Zharkov, Andrey L. Stepanov
Abstract: Co and Ni nanoparticles were fabricated in fused silica plates by ion implantation technique. Electron microscopy showed the nanoparticles to be of spherical shape. Magnetic circular dichroism (MCD) was investigated in the spectral range 1.2 - 4.2 eV in a field of about 3 kOe. MCD spectra are considerably different from the spectra of thin nickel and cobalt films. MCD spectra for Ni nanoparticles are associated with surface plasmon resonance.
Showing 1 to 2 of 2 Paper Titles