Papers by Keyword: High Resolution Electron Microscopy (HREM)

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Authors: Jean-Louis Chermant, F. Doreau, Jean Vicens
Authors: F. Lin, Qing Chen, Lian Mao Peng
Abstract: A new procedure is proposed for the exit electron wave reconstruction using a small set of high-resolution electron microscopy (HREM) images. This procedure is similar to that proposed by van Dyck and coworkers, but the relative shifts between different HREM images are obtained via the genetic algorithm instead of the more widely used cross-correlation function (XCF) method. The new procedure is demonstrated using simulated HREM images with added noise, and shown to be able to deal with situation where the scheme based on the method of XCF is not applicable.
Authors: Alkyoni Mantzari, Christos B. Lioutas, Efstathios K. Polychroniadis
Abstract: The aim of the present work is to study the evolution and the annihilation of inversion domain boundaries in 3C-SiC during growth. For this investigation conventional and high resolution transmission electron microscopy were employed. It is shown that the physical mechanism which results in the annihilation of inversion domain boundaries in 3C-SiC starting from the 3C-SiC/Si interface is the change of the crystallographic planes in which inversion domain boundaries propagate into the {111} ones. In all cases modeling and simulation analysis by EMS software [1] are in agreement with the experimental results.
Authors: Masanori Kohyama, Kenji Tanaka
Authors: Thierry Epicier, G. Guichon, D. Dafir, P. Merle
Authors: Eiichi Sato, H. Morioka, Kazuhiko Kuribayashi, D. Sundararaman
Authors: L. Guétaz, Jean-Michel Pénisson
Authors: B. Barbaray, V. Potin, Piere Ruterana, Gerard Nouet
Showing 1 to 10 of 91 Paper Titles