Papers by Keyword: Line Profile Analysis

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Authors: Paolo Scardi, Matteo Leoni, G. Cappuccio, J.I. Langford, Robert J. Cernik
Authors: Thomas. H. Simm, Philip J. Withers, Tamás Ungár, J. Fonseca
Abstract: Uniaxial deformed fcc metal samples have been studied by diffraction peak profile analysis. A method that can explain changes in broadening of different peaks by use of a Taylor model has been investigated. It was found that the method qualitatively describes the changes in broadening in nickel and stainless steel samples. It is argued that the differences between predictions and measurements are a feature of how the different samples deform at the microstructural scale.
Authors: Nathalie Audebrand, Daniel Louër
Abstract: The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection effects at the origin of diffraction line broadening. The propagation of errors, i.e. old errors and new errors related to profile fitting techniques, is commented. The experimental conditions for minimising errors are described. Representative examples of microstructure characterisation of nanopowders are presented.
Authors: Matteo Leoni, Jorge Martinez-Garcia, Paolo Scardi
Abstract: Whole Powder Pattern Modeling (WPPM) is especially useful to study line defects in powder and polycrystalline materials. As a result of recent progresses in this field, dislocation studies can be carried out for any slip system and crystal symmetry of the studied phases. Basic theory and procedures are described with the help of some representative cases of study. The use of the dislocation-related broadening in the PM2K software implementing the WPPM approach is shown with practical examples.
Authors: Paolo Scardi, Matteo Ortolani, Matteo Leoni
Abstract: The basics of the Whole Powder Pattern Modeling and its implementation in the PM2K software are briefly reviewed. The main features and functionalities, and most common line broadening models are introduced with the aid of working examples related to the instrumental profile and to a plastically deformed metal. A summary of the main expressions is reported in the appendix, together with a list of useful references.
Authors: Giora Kimmel, David Dayan, Jacob Zabicky
Authors: Masayoshi Kumagai, Koichi Akita, Muneyuki Imafuku, Shinichi Ohya
Abstract: Microstructure and residual stress in AISI316 stainless steels processed via shot peening (SP) and laser peening (LP) were evaluated using X-ray line profile analysis and residual stress measurements. Although both specimens exhibited similar compressive residual stress profiles in the depth direction, the dislocation density in the SP specimen was greater than that in the LP specimen, while the crystallite size in the SP specimen was less than that of the LP specimen. Thus, the variation in the microstructural features in the samples subjected to the two processes differed.
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