Papers by Keyword: Multilayer

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Authors: Sebastien Bertrand, O. Boisron, R. Pailler, Jacques Lamon, Roger R. Naslain
Authors: A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek
Abstract: Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction of measurement time at the powder diffractometers by a factor up to 100 compared to instruments with a single counter, while maintaining comparable count statistics. Present work describes a 128-channel detector working with a standard diffractometer. The detector is 12.8 mm long and covers the angular range of 3.2 deg. We discuss the diffraction geometry in real and reciprocal space, the FWHM of diffraction peaks, and the background level. Measurements were made on standard samples and on complex samples of industrial importance (e. g., portland clinker). Applications of the detector to diffraction measurements of single crystals and thin films are discussed briefly.
Authors: Charles Moy, Massimiliano Bocciarelli, Simon P. Ringer, Gianluca Ranzi
Abstract: This article presents an inverse analysis method based on an instrumented indention to extract materials properties from multilayer material systems. In this case, a 12-layers system comprising of two alternate materials is considered. Each layer is 1 μm thick. The material properties selected for the layers are within the range of common commercial aluminium alloys. The yield stress and strain hardening exponent of the two layers were identified based on a power law type equation to define the stress-strain relationship. A 2D axis-symmetric indenter having 70.3 half angle was used, which is representative of a Berkovich or a Vickers indenter. The use of finite element analyses was substituted with a fast and equally accurate approach for the iterative optimization procedure. Thus, the computation time was considerably reduced. The robustness is tested using pseudo-experimental results, in terms of indentation curve and imprint on the material, with added random noises of 2.5%, 5.0%, 7.5% and 10.0%. The proposed approach provides a good estimate of the sought material properties. It is envisaged that this approach can become of assistance in the evaluation of the material properties for multilayer coatings and small devices.
Authors: Mei Liu, Hai Hui Ruan, Liang Chi Zhang
Abstract: To meet different electrical or optical functionalities, thin films are often of multiple layers processed at high temperatures. Substantial residual stresses can therefore develop in such thin film systems due to the disparate thermal properties of the individual material layers. High stresses can lead to mechanical failure of the systems and thus understanding the residual stresses in thin film systems is important. This paper presents a systematic way to characterize the residual stresses in epitaxial, polycrystalline and amorphous layers by using X-ray diffraction (XRD) techniques. The single-point XRD pattern renders the stresses of crystalline layers and the scanning XRD gives the curvature of the whole film. Based on the newly-developed analytical model, the residual stresses of each layer can all be determined.
Authors: Li Liang, Hong Wei Wang
Abstract: Segmentation of motion in an image sequence is one of the most challenging problems in image processing, while at the same time one that finds numerous applications. In this paper, we propose a robust multi-layer background subtraction technique and seed region growing approach which takes advantages of local texture features represented by local binary patterns (LBP) and photometric invariant color measurements in RGB color space. Due to the use of hybridization of layer-based strategy and seed region growing approach, the approach can model moving background pixels with quasiperiodic flickering as well as background scenes which may vary over time due to the addition and removal of long-time stationary objects. The experiment results prove that in the view of the sport image segmentation, this algorithm provides fast segmentation with high perceptual segmentation quality.
Authors: Cheng Wei Kang, Bing Jun Hao, Han Huang
Abstract: This study aimed to investigate the effect of grinding conditions, including depth of cut and grinding direction, on the material removal and surface finish of multilayered thin film structures. It was found that the increase in depth of cut improved the material removal rate, but worsened the ground surface finish. The grinding perpendicular to the thin films caused less damage and produced better surface than that parallel to the films. The characteristics of wheel wear were also studied. Grit pull-out and micro-fracture should be attributed to the wheel wear.
Authors: Ji Ho Lim, Ji Soon Kim, Kyoung Wook Paik, Y.Y. Earmme
Authors: X. Wei, I. Mogami, G. Kawamura, Hiroyuki Muto, Atsunori Matsuda
Abstract: The flip-flop property is an attractive phenomenon on the surface of Nafion® thin film. The sulfonic groups which are hydrophilic can change the wettability of the surface by lift up or curling down. In this study, an applied voltage makes the control of sulfonic groups become available. It has been proved that when a positive voltage is loading to the film through a conductive droplet, the flip-flop property can be enhanced. Being the opposite, it also can be inhibited by a negative voltage.
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