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Strains in Thermally Growing Alumina Films Measured In-Situ Using Synchrotron X-Rays

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Abstract:

Strains in thermally grown oxides have been measured in-situ, as the oxides develop and evolve. Extensive data have been acquired from oxides grown in air at elevated temperatures on different model alloys that form Al2O3. Using synchrotron x-rays at the Advanced Photon Source (Beamline 12BM, Argonne National Laboratory), Debye-Scherrer diffraction patterns from the oxidizing specimen were recorded every 5 minutes during oxidation and subsequent cooling. The diffraction patterns were analyzed to determine strains in the oxides, as well as phase changes and the degree of texture. To study a specimen's response to stress perturbation, the oxidizing temperature was quickly cooled from 1100 to 950oC to impose a compressive thermal stress in the scale. This paper describes this new experimental approach and gives examples from oxidized β-NiAl, Fe-20Cr-10Al, Fe-28Al-5Cr and H2- annealed Fe-28Al-5Cr (all at. %) alloys to illustrate some current understanding of the development and relaxation of growth stresses in Al2O3.

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Periodical:

Materials Science Forum (Volumes 522-523)

Pages:

433-440

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.522-523.433

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Online since:

August 2006

Authors:

Peggy Y. Hou, A.P. Paulikas, B.W. Veal

Keywords:

Al2O3, Cr2O3, Growth Stress, Oxide Creep, X-Ray Diffraction (XRD)

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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