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Preparation of Ferroelectric K0.5Na0.5NbO3 Films by Sol-Gel Processing

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Abstract:

Orthorhombic perovskite-type K0.5Na0.5NbO3 (KNN) films on Pt/Ti/SiO2/Si substrates were prepared by sol-gel processing. The morphology of the films was characterized using SEM and AFM. The KNN films with a total thickness of about 0.5 micron had relatively dense and uniform microstructure. The ferroelectricity of the KNN films was confirmed by polarization-electric field (P-E) hysteresis loop.

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Periodical:

Key Engineering Materials (Volumes 336-338)

Pages:

203-205

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.336-338.203

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Online since:

April 2007

Authors:

Feng Ping Lai, Jing Feng Li, Wen Gong

Keywords:

KNN, Lead-Free, Piezoelectric, Sol-Gel (SG)

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, M. Nakamura: Nature, Vol. 432 (2001), p.84.

DOI: 10.1038/nature03028

Google Scholar

[2] C. R. Cho, B. M. Moon: Integr. Ferroelectr. Vol. 45 (2002), p.39.

Google Scholar

[3] M. Takahashi, K. Yamauchi, T. Yagi: Thin Solid Films, Vol. 458(2004), p.108.

Google Scholar

[4] T. Arai, S. Ito, K. Ishikawa and K, Nakamura: Jpn. J. Appl. Phys. Vol. 42 (2003) p.6019.

Google Scholar

[5] S. Hirano, T. Yogo, W. Sakamoto, Y. Takeichi, S. Ono. T. Saito, T. Wada, H. Adachi: Jpn. J. Appl. Phys. Vol 43, No. 9B (2004), p.6627.

Google Scholar

[6] W. Gong, J.F. Li, X.C. Chu, J. Euro. Ceram. Soc. Vol. 24 (2004).

Google Scholar