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Mapping Partially Recrystallised Structures by 3DXRD

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Abstract:

A partially recrystallised sample has been characterised by 3DXRD. A gauge volume of 200μm × 700μm × 300μm has been fully mapped. Deformed and recrystallised regions within the selected gauge volume are distinguished based on the sharpness of the diffraction spots. Information corresponding to a 5D (Φ1, Φ, Φ2, z, x · y) map is deducted from the 3DXRD data.

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Periodical:

Materials Science Forum (Volumes 558-559)

Pages:

389-394

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.558-559.389

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Online since:

October 2007

Authors:

S.S. West, Grethe Winther, L. Margulies, Erik Knudsen, Henning O. Soerensen, Søren Schmidt, Dorte Juul Jensen

Keywords:

3DXRD, 5D Maps, Partially Recrystallised Structures

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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