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Influence of Localized Primary Recrystallization Texture on Secondary Recrystallized Grains in Fe-3%Si

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Abstract:

The local-area analyses of the primary recrystallization sheets were carried out in Fe-3%Si to explain the reason why only Goss appears during the secondary recrystallization. It was found in the present study that Goss grains have the higher Σ9 frequency in their nearest neighbors than {311}<011> grains, both of which were attached to the neighbors having the texture with high Σ9 frequency to the texture of the matrix. Another analysis showed that Σ1 and Σ3 frequencies were higher around {311}<011> grains than around Goss. It is concluded that Goss grains possess the satisfactory criteria to be the secondary recrystallization nuclei from the following viewpoints of high Σ9 frequency and low Σ1 and Σ3 frequencies.

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Periodical:

Materials Science Forum (Volumes 558-559)

Pages:

771-776

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.558-559.771

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Online since:

October 2007

Authors:

N. Morishige, Kenichi Murakami, Hotaka Homma

Keywords:

CSL Grains, EBSD Method, Grain Oriented Silicon Steel, Secondary Recrystallization

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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