Interface Strength of Low-Dimensional Nano-Components

Article Preview

Abstract:

The interface strength of low-dimensional nano-components such as films and islands formed on substrates has been investigated in this project, and the focus is put on the mechanics of crack initiation from the free interface edge and propagation along the interface. The series of experiments elucidates the applicability of fracture mechanics concept on the structures. We proposed experimental methods for evaluating the initiation strength of an interface crack in submicron films and islands deposited on substrates. The initiation is governed by the singular stress field, and the criterion is prescribed by the stress intensity parameter. Using special loading apparatus built in a TEM, we developed a crack initiation method for nano-components and the role of plasticity on the delamination is clarified. Subcritical crack growth along an interface between submicron films under fatigue was also investigated by modified four-point bend method.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 353-358)

Pages:

1-8

Citation:

Online since:

September 2007

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2007 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] T. Kitamura, T. Shibutani and T. Ueno: Engng. Fract. Mech. Vol. 69 (2002), p.1289.

Google Scholar

[2] T. Kitamura, H. Hirakata and T. Itsuji: Engng. Fract. Mech. Vol. 70 (2003), p. (2089).

Google Scholar

[3] H. Hirakata, Y. Takahashi, S. Matsumoto and T. Kitamura: Engng. Fract. Mech. Vol. 73 (2006), p.2698.

Google Scholar

[4] H. Hirakata, T. Kitamura and Y. Yamamoto: Int. J. Solids Structures Vol. 41 (2004), p.3243.

Google Scholar

[5] H. Hirakata, T. Kitamura and Y. Yamamoto: JSME Int. J. A Vol. 47 (2004), p.324.

Google Scholar

[6] For example, J.N. Florando and W.D. Nix: J. Mech. Phys. Solids Vol. 53 (2005), p.619.

Google Scholar

[7] H. Hirakata, Y. Takahashi, D.V. Truong and T. Kitamura: Int. J. Fract., submitted.

Google Scholar

[8] H. Hirakata, M. Kitazawa and T. Kitamura: Acta Mater. Vol. 54 (2006), p.89.

Google Scholar

[9] D.V. Truong, H. Hirakata and T. Kitamura: JSME Int. J. A Vol. 49 (2006), p.370.

Google Scholar

[10] D.B. Bogy: J. Appl. Mech. Vol. 35 (1968), p.460.

Google Scholar

[11] F. Shang, T. Kitamura, H. Hirakata, I. Kanno, H. Kotera and K. Terada: Int. J. Solids Structures Vol. 42 (2005), p.1729.

Google Scholar

[12] F. Shang, T. Kitamura and H. Hirakata: Integrated Ferroelectrics Vol. 73 (2005), p.67.

Google Scholar

[13] T. Kitamura, H. Hirakata and D.V. Truong: Thin Solid Films, in press.

Google Scholar

[14] H.D. Espinosa, B.C. Prorok and B. Peng: J. Mech. Phys. Solids Vol. 52 (2004), p.667.

Google Scholar

[15] R.P. Vinci, E.M. Zielinski and J.C. Bravman, Thin Solid Films Vol. 262 (1995), p.142.

Google Scholar

[16] J.Q. Xu, L.D. Fu and Y. Mutoh: JSME Int. J. A Vol. 45 (2002), p.177.

Google Scholar