Adhesion Promoter and Anti-Sticking Layer Effects on Adhesion Properties Using Symmetric AFM Probe

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Abstract:

The reliable reproducibility of nano patterns or other nano structures is one of many issues in the nano-imprint lithography process. An important prerequisite for reproducibility is suitable adhesion properties of adhesion promoters or anti-sticking layer. In this study, rhombus shaped symmetrical probe with a flat tip was developed and fabricated using MEMS fabrication technique. For the experimental setup of the adhesion test using a UV curable PAK01 resin coated AFM tip with several adhesion promoters, the flat tip is covered by PAK01 resist using micromanipulator. Anti-sticking layers of silane agents were prepared on the tip by vapor deposition method. Adhesion force between various adhesion promoters (GPTS, APMDS, APTS, DUV30J, O2 planairzation) and PAK01 resist and the force between anti-sticking layer (FOTS, DDMS) and PAK01 resist were evaluated using the force-distance mode of AFM. Adhesion force of GPTS and FOTS are about 7180 nN and 1660 nN, respectively.

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Advanced Materials Research (Volumes 26-28)

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1113-1116

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October 2007

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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[1] E. S. Lee, J. H. Jeong, Y. S. Sim, K. D. Kim, D. G. Choi and J. H. Choi : Current Applied Physics 6S1 (2006), p. e92.

Google Scholar

[2] M. Otto, M. Bender, F. Richter, B. Hadam, T. Kliem, R. Jede, B. Spangenberg and H. Kurz: Microoelectronic Engineering 73-74 (2004), p.152.

Google Scholar

[3] M. Bender, A. Fuchs, U. Plachetka and H. Kurz : Microelectronic Engineering 83, (2006), p.827.

Google Scholar

[4] W. S. Kim, J. H. Jin and B. S. Bae : Nanotechnology 17, (2006), p.1212.

Google Scholar

[5] F. L. Leite and P. S. P. Herrmann : J. Adhesion Sci. Technol., 19, 3-5, (2005), p.365.

Google Scholar

[6] H. J. Lee, K. Cho, J. H. Kim, Y. E. Yoo and J. M. Kim, C. W. Baek : Proceeding of 2005 KSME Fall Conference (2005).

Google Scholar

[7] K. Cho, H. J. Lee, J.M. Kim and C.W. Baek : NanoKorea 2005, (2005), p.665.

Google Scholar

[8] H.J. Lee, J.H. Kim, K. Cho, S.W. Han, J.Y. Lee, Y.E. Yoo, W.D. Kim and K.S. Kim : Proceeding of 2006 KSME Spring Conference (2006).

Google Scholar