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HomeMaterials Science ForumMaterials Science Forum Vols. 255-257A Combined Positron Microprobe - Scanning Electron...

A Combined Positron Microprobe - Scanning Electron Microscope for Positron-Annihilation Spectroscopy with a Spatial Resolution in the Micron Range

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Periodical:

Materials Science Forum (Volumes 255-257)

Pages:

641-643

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.255-257.641

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Online since:

September 1997

Authors:

H. Greif, M. Haaks, U. Holzwarth, U. Männig, M. Tongbhoyai, Karin Maier

Keywords:

Cone Moderator, Copper (Cu), Defect, Mircobeam, Small Source

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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