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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381Deconvolution of X-Ray Diffraction Profiles Using...

Deconvolution of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study of Polycrystalline 9-YSZ

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

18-23

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.18

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Online since:

October 2001

Authors:

Florentino Sánchez-Bajo, A.L. Ortiz, F.L. Cumbrera

Keywords:

Deconvolution Procedures, Integral-Breadth Method, Line Broadening Techniques

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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