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Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis

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Periodical:

Materials Science Forum (Volumes 414-415)

Pages:

229-234

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.414-415.229

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Online since:

January 2003

Authors:

Jenő Gubicza, Iuliana C. Dragomir, Gábor Ribárik, Yuntian T. Zhu, Ruslan Valiev, Tamás Ungár

Keywords:

Crystallite Size Distribution, Dislocation Structure, Plastic Deformation, Titanium (Ti), X-Ray Peak Profile Analysis

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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