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Development of BaTiO3 Based X7R Wafers for Single-Layer Capacitors
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Two Methods for the Measurement of Complex Permittivity of Microwave Dielectric Ceramics

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Abstract:

Two measuring techniques, the parallel plate method and the cylinder cavity perturbation method, for complex permittivity of microwave dielectric ceramics were introduced. Attention was focused on the theoretical consideration of measurement precision and suitable applications of the techniques.

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Periodical:

Key Engineering Materials (Volumes 280-283)

Pages:

61-64

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.280-283.61

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Cite this paper

Online since:

February 2007

Authors:

F. Xiao, R. Chen, Zhi Hong Huang, Zhao Xian Xiong

Keywords:

Complex Permittivity, Dielectric Ceramics, Microwave Measurement

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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References

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