Paper Titles

Unbiased Evaluation of Chord Length Distributions from Orientation Maps
p.219

Extension of Orientation Mapping to the Transmission Electron Microscope
p.225

Effect of Orientation Noise on the Determination of Percolation Thresholds from Electron Back-Scatter Pattern Data
p.231

Three-Dimensional Texture Analysis
p.237

High Resolution Texture Analysis with Spherical Wavelets
p.245

Combined Synchrotron and Neutron Strcutural Refinement of R-Phase in Ti_50.75.Ni_47.75.Fe_1.50 Shape Memory Alloy
p.255

On Probability - Statistical Representation of Pole Figures for Materials with Hexagonal Symmetry
p.261

Determination of an ODF from Diffraction Measurements Based on Optimal Smoothing Splines
p.267

The Influence of Errors of X-Ray Texture Measurements on ODF Calculation with Central Normal Distribution Approximation
p.273

HomeMaterials Science ForumMaterials Science Forum Vols. 495-497High Resolution Texture Analysis with Spherical...

High Resolution Texture Analysis with Spherical Wavelets

Article Preview

Abstract:

You might also be interested in these eBooks

Textures of Materials - ICOTOM 14

Info:

Periodical:

Materials Science Forum (Volumes 495-497)

Pages:

245-254

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.495-497.245

Citation:

Cite this paper

Online since:

September 2005

Authors:

Helmut Schaeben, Swanhild Bernstein, Ralf Hielscher, Judith Beckmann, Jens Keiner, Jürgen Prestin

Keywords:

Crystallographic X-Ray Transform, Harmonic Representation, Harmonic Spaces, Multi-Scale Representation, Scaling Spaces, Spherical Radon Transform

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2005 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: