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Carbon Nanotube as Probe for Atomic Force Microscope

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Abstract:

An improved arc welding method was developed to fabricate carbon nanotube probe under direct view of optical microscope. The new fabrication method here needs not coat silicon probe in advance with metal film, which greatly reduces the fabrication’s difficulty. An easy method for shortening the nanotube probe was also developed. The improved fabrication method here is simple and reliable. The fabricated carbon nanotube probe showed good properties of higher length-to-diameter aspect ratio, better wear characteristics than silicon probe.

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Periodical:

Key Engineering Materials (Volumes 315-316)

Pages:

758-761

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.315-316.758

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Online since:

July 2006

Authors:

Zong Wei Xu, Ying Chun Liang, Shen Dong, Li Qiang Gu, T. Sun, Qing Liang Zhao

Keywords:

Atomic Force Microscope (AFM), Carbon Nanotube (CN), Fabrication, Probe, Wear

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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