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Diffusion in Materials - DIMAT2004

Defect and Diffusion Forum Volumes 237 - 240

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• p224 Inverse T-Sample Method of Determination of the Interdiffusion Coefficients in the Cu-Ni-Sn System   [ 588 K ]
  Authors: Yu.A. Lyashenko, V.V. Bogdanov
• p230 Analyzing Linear Multicomponent Diffusion Phenomena   [ 387 K ]
  Authors: Afina Lupulescu, Martin E. Glicksman, Srividya Kailasam
• p238 Influence of Platinum and Palladium on Diffusion in β-NiAl Phase   [ 225 K ]
  Authors: Régis Bouchet, Rémy Mévrel
• p244 Activation Energies from Sampling Simulations of Diffusion Paths   [ 289 K ]
  Authors: Gilles Adjanor, Manuel Athènes
• p250 Modelling of Interdiffusion and Reactions at the Boundary; Initial-Value Problem of Interdiffusion in the Open System   [ 155 K ]
  Authors: Robert Filipek
• p257 Numerical Analysis of Interdiffusion in Multi-Component Systems   [ 122 K ]
  Authors: Robert Filipek, K. Szyszkiewicz-Warzecha
• p266 Measurement of the Impurity Diffusivity of Cu in Fe by Laser Induced Breakdown Spectrometry   [ 130 K ]
  Authors: Chan Gyu Lee, Jung Han Lee, Byeong Seon Lee, Yong Ill Lee, Toshitada Shimozaki, Takahisa Okino
• p271 Atomistic Modeling of Diffusion in the TiAl Compound   [ 330 K ]
  Authors: Yuri M. Mishin, Irina V. Belova, Graeme E. Murch
• p277 First Study of Iron Self-Diffusion in Fe₂O₃ Single Crystals by SIMS   [ 141 K ]
  Authors: Antônio Claret Soares Sabioni, Antônio Márcio J.M. Daniel, W.A.A. Macedo, M.D. Martins, Anne Marie Huntz, François Jomard, A.I.C. Persiano
• p282 Tracer Diffusion and Ionic Conduction in Standard Silica Glasses   [ 171 K ]
  Authors: Eugene M. Tanguep Njiokep, Helmut Mehrer
• p291 Random-Walk Calculations in Intermetallic Compounds   [ 841 K ]
  Authors: Irina V. Belova, Graeme E. Murch
• p303 Kinetic Methods for Studying the Transport Properties of Transition Metal Oxides and Sulphides   [ 691 K ]
  Authors: Stanisław Mrowec
• p317 Oxygen Diffusion in Doped Polycrystalline Alpha-Alumina. Influence of Grain Size and Dopant Amount   [ 217 K ]
  Authors: Bernard Lesage, Corinne Legros, Günter Borchardt, G. Strehl, Martin Kilo, François Jomard
• p322 Defects and Diffusion in d-AlNiCo-Quasicrystals - Application of Mechanical Spectroscopy   [ 258 K ]
  Authors: M. Weller, B. Damson, Michael Feuerbacher
• p328 Iridium Diffusion into Silicon Wafers as a Means to Determine Silicon Vacancy Concentrations   [ 271 K ]
  Authors: Ludmila Lerner, Nicolaas Stolwijk