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Advanced Nondestructive Evaluation I

Key Engineering Materials Volumes 321 - 323

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• p71 Development of Novel Optical Fiber AE Sensor with Multi-Sensing Function   [ 376 K ]
  Authors: Hideo Cho, Takashi Naruse, Takuma Matsuo, Mikio Takemoto
• p77 Measurement for In-Plane Displacement of Tensile Plates with Through-Thickness Circular Hole and Partly Through-Thickness Circular Hole by Use of Speckle Interferometry   [ 1 M ]
  Authors: Myung Soo Kim, Tae Hyun Baek
• p81 Test and Evaluation of a Newly Built Multi-Purpose Transmission Type Polariscope   [ 1 M ]
  Authors: Tae Hyun Baek, Myung Soo Kim
• p87 The Detection and Imaging of Internal Defect Using ESPI-Based Strain Analysis   [ 453 K ]
  Authors: Tae Hun Lee, Kyung Young Jhang
• p91 An Optical Method for the Detection of In-Plane Motion of Acoustic Waves Propagating in Solids   [ 193 K ]
  Authors: Che Hua Yang, Yua Ching Tsai
• p95 Quantitative Vibration Amplitude Measurement Using Stroboscopic Phase Shifting ESPI   [ 2 M ]
  Authors: Hyun Chul Jung, Koung Suk Kim
• p99 Surface Roughness Measurement by Using Interferometer and Active Interferometer Stabilization   [ 196 K ]
  Authors: Jin Tae Kim, Dohyoung Kim, Hyun Su Kim, Jong Rak Park
• p103 Suppressing Technique of the Antisymmetric Mode by the Superposition of Lamb Waves Generated by Two Laser Beams in a Thin Plate   [ 288 K ]
  Authors: Seung Seok Lee, Sang Whoe Dho
• p108 Absolute Single-Mode Lamb Wave Generation by Laser in a Thin Plate   [ 378 K ]
  Authors: Seung Seok Lee, Sang Whoe Dho
• p112 Influence of Shearing Amount on Detecting Crack-Shaped Internal Defect by Shearography   [ 208 K ]
  Authors: Ki Soo Kang, Koung Suk Kim, Hyun Chul Jung, Heo Sub Jang
• p116 Out-of-Plane Micro-ESPI System for Measurement of Mechanical Properties of Film Materials   [ 547 K ]
  Authors: Dong Iel Kim, Yong Hak Huh, Chang Doo Kee
• p121 Residual Stress Evaluation of Thin Film Using Strip Bending Test   [ 152 K ]
  Authors: Jae Hyun Kim, Hak Joo Lee, Seung Woo Han, Jong Man Kim, Chang Wook Baek
• p125 Gas Electron Multipliers for Potential Applications to Digital Radiography   [ 722 K ]
  Authors: Hyo Sung Cho, Sung Il Choi, Hok Yung Kim, Bong Soo Lee, Sin Kim
• p129 A Correction of Geometric Error of Nano-Indenter Using Atomic Force Microscope and Finite Element Method   [ 165 K ]
  Authors: Seung Baek, Sung Kuen Cho, Chang Sung Seok
• p132 Design and Characterization of Capacitive Micromachined Ultrasonic Transducer   [ 391 K ]
  Authors: Bong Young Ahn, Ki Bok Kim, Hae Won Park, Young Joo Kim, Yong Seok Kwak