Engineered Materials
Key Engineering Materials Volumes 86 - 87
doi:10.4028/www.scientific.net/KEM.86-87
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p231
Scanning Force Microscopy and Its Application to Engineered Materials
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176 K
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Authors: L. McDonnell, M.E. Woods, M. Phelan, J. Nieuwenhuizen, A. Thissen, J. Alexandre, E. Hayes, E.M. Cashell
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p237
Development of a Digital Speckle Correlation System for Use in the Non-Destructive Testing of Advanced Engineering Ceramics
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294 K
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Authors: D. Coburn, J.A. Slevin
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p245
Indentation Induced Debonding of Magnetron Sputtered Silver Layers on Glass from Experimental and Finite Element Studies
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168 K
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Authors: Murt Redington, M.T. Laugier
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p255
Apatite-Mullite Glass-Ceramics
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231 K
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Authors: R. Hill, D. Wood
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p263
Sintering of Silicon Nitride Ceramics and Composites
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546 K
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Authors: Y.J. Song, D. O'Sullivan, R. Flynn, Stuart Hampshire
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p271
Effect of Z-Value on Densification and Properties of Sialon-SiC Matrices and Composites
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373 K
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Authors: R. Ramesh, Michael J. Pomeroy
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p279
Development of a New Method for the R-Curve Determination of Ceramic Materials
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382 K
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Authors: J.C. Descamps, A. Poulet, P. Descamps, F. Cambier
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p287
Effects of Processing Variables on Microstructure Development of ZnO Ceramics for Varistor Applications
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402 K
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Authors: R. Puyané, F. Toal, Stuart Hampshire
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p295
Influence of Heat Treatment, Dopant and Impurity Content on Creep Parameters of Superplastic Zirconia
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307 K
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Authors: P. Descamps, F. Cambier, Anne Leriche
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p301
A Critical Re-Evaluation of the Abrasive Wear of Brittle Solids
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208 K
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Authors: A.J. Carr
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p307
Simulation of Ion Beam-Induced Collisional Processes in Thin Film Titanium Silicide
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213 K
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Authors: M. O'Connor, G.M. Crean, J.P. Biersack
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p313
Materials Engineering Aspects of Magneto-Optic Recording Materials
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341 K
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Authors: I.Z. Rahman, M.A. Kenny, M.A. Rahman
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p321
Preparation and Characterisation of Insulating Homogeneous Thick Films
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385 K
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Authors: T.M. Raftery, T.R. Spalding
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p329
Finite Element Thermal Modelling of the Laser Soldering Process
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320 K
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Authors: A. Flanagan, G. Lowe, T.J. Glynn
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p337
Visible and Infrared Optical Reflectance Spectroscopy of Silicon on Insulator Substrates
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321 K
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Authors: M. O'Keeffe, S. Lynch, G.M. Crean