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European Powder Diffraction 4

Materials Science Forum Volumes 228 - 231

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• p89 Analysis of Peak Shapes in X-Ray Diffractometry (GUINIER Geometry) of Standard Materials Using Asymmetric Profile Functions   [ 209 K ]
  Authors: A.M. Schneider, W. Paszkowicz, P. Behrens, J. Felsche
• p95 Diffraction Anomalous Fine Structure Analysis on (Bi,Pb)₂PtO₄ Powders   [ 393 K ]
  Authors: J. Vacinova, J.-L. Hodeau, P. Bordet, M. Anne, D.E. Cox, A. Finch, P. Pattison, W. Schweggle, H. Graafsma, Å. Kvick
• p101 Rapid Polymer Identification with X-Ray Diffraction   [ 175 K ]
  Authors: S. Haaga, W. Engel, M. Tietz, H.-J. Radusch
• p107 An Improved X-Ray Image Plate Detector for Diffractometry   [ 437 K ]
  Authors: M. Thoms, H. Burzlaff, A. Kinne, J. Lange, H. von Seggern, R. Spengler, Albrecht Winnacker
• p113 Refinement of Powder Diffraction Data Collected Using Imaging Plates   [ 320 K ]
  Authors: D.J. Cookson, G.J. Foran, B.A. Hunter, Ismunandar, Brendan J. Kennedy
• p119 X-Ray Imaging Using Fluorescence or Polycrystalline Diffraction   [ 405 K ]
  Authors: Thomas Wroblewski
• p125 Stress Analysis Using an Area Detector   [ 246 K ]
  Authors: A. Schubert, Bernd Michel, B. Kämpfe
• p131 A Fully Automated High-Temperature Powder Diffractometer   [ 262 K ]
  Authors: A. Kern, W. Eysel
• p137 A New High-Temperature Camera   [ 153 K ]
  Authors: B. Koppelhuber-Bitschnau, F.A. Mautner, P. Worsch, J. Gautsch
• p143 A Low-Temperature Option Down to -70° C for a High-Temperature Attachment   [ 153 K ]
  Authors: B. Baumgartner
• p147 In-Situ Time Resolved Synchrotron Powder Diffraction Studies of Syntheses and Chemical Reactions   [ 325 K ]
  Authors: P. Norby
• p153 Assessment of an In-Situ Reactor Cell: Temperature Calibration and Reliability of Diffracted Intensity   [ 302 K ]
  Authors: M. Bellotto, B. Rebours
• p161 Profile Smoothing and Differentation with Reciprocal Polynomials   [ 127 K ]
  Authors: L.A. Solovyov
• p165 How to Solve the Problems for the Indexation of Complex Materials Using Laboratory Powder Diffraction: Application to Metal Phosphonates   [ 263 K ]
  Authors: A. Cabeza, Miguel Ángel G. Aranda, M. Martínez-Lara, S. Bruque
• p171 Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry   [ 286 K ]
  Authors: W. Pitschke