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European Powder Diffraction

Materials Science Forum Volumes 79 - 82

• Papers
• Abstracts

• p875 Characterization of Oxygen-Electrode/Electrolyte Interface Reactions in Solid Oxide Fuel Cells by X-Ray Diffraction Measurements   [ 396 K ]
  Authors: E. Ivers-Tiffée, B. Jobst, Ivo Kraus, R. Schachtner, M. Schiessl
• p883 Thermal Behaviour of Molecular Sieves (SAPO-11/AlPO-11 Type) Investigated by Synchrotron Radiation X-Ray Diffraction (SRXD)   [ 73 K ]
  Authors: F. Neissendorfer, E. Jahn, S.N. Gusenko, M.A. Sheromov
• p887 Hydrogen Loss and Interdiffusion in Amorphous Si/SiC Multlayers   [ 220 K ]
  Authors: G. Zorn, J. Kolodzey, H. Göbel, T. Fischer, P. Hanesch, R. Schwarz
• p893 Observation of Annealing Effects in Ti/TiN-Diffusion Barriers using High-Temperature X-Ray Diffraction   [ 382 K ]
  Authors: G. Zorn, H. Joswig
• p903 Structure of TiN Thin Film Grains in Dependence on their Crystallographic Orientation   [ 221 K ]
  Authors: V. Valvoda, R. Cerný, Radomír Kužel, M. Blomberg, M. Merisalo
• p909 Heat-Treated NiO and Changes of Microstructural Parameters   [ 225 K ]
  Authors: S. Pocev, B. Marina, S. Bogoevski
• p915 X-Ray Determination of Characteristics of Finely Dispersed Supports and Supported Catalysts   [ 176 K ]
  Authors: E.M. Moroz, V.A. Ushakov, S.V. Bogdanov
• p919 Indexing of New Superconducting Oxide Powder Patterns   [ 305 K ]
  Authors: J. Hauck, B. Bischof, N. Dockal, E. Droste, C. Feiburg, H. Hindriks, S. Ipta, F. Klumpe, K. Mika, A. Preikschat
• p927 Stoichiometry and Temperature Dependence of YBa₂Cu₃O_x Structure Parameters   [ 215 K ]
  Authors: G. Försterling, I.V. Golosovsky, W. Plakhty
• p935 Temperature Dependence of the Lattice Constants of YBa₂Cu₃O_7-x   [ 94 K ]
  Authors: U. Wachtel, M.G. Gorskaja, S.K. Filatow, P. Paufler, W. Schmitz, W. Reichelt
• p941 Growth of YBa₂Cu₃O_7-x Thin Films on R-Plane Sapphire (O112) Using Yttria Stabilized Zirconia (YSZ) Buffer Layers   [ 265 K ]
  Authors: K. Hradil, Harald Schmidt, W. Hösler, W. Wersing, F. Frey, B. Jobst, G. Zorn
• p947 X-Ray Absorption and Reflection in Materials Science   [ 544 K ]
  Authors: B. Lengeler
• p959 Some Sample Preparation Methods for Powder Diffraction at Neste Oy   [ 389 K ]
  Authors: H. Oesterholm, J. Vilhunen
• p965 Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods   [ 203 K ]
  Authors: Th. Gerber, B. Himmel, U. Buttler, H. Bürger, U. Bräutigam
• p971 Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-T_c Superconductors   [ 385 K ]
  Authors: O. Eibl, H. Budin, P. Pongratz, P. Skalicky