Papers by Author: Bob B. He

Abstract: This paper introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in residual stress analysis in thin films. The stress measurement with twodimensional x-ray diffraction can be done with low incident angle and is not limited to the peaks with high two-theta angles like the conventional method. When residual stresses of thin films are measured, a low incident angle is preferred to maximize the diffraction signals from the thin films surfaces instead of from the substrates and matrix materials. Since one stress measurement at one fixed incident angle is possible, stress gradients in depth can be measured by series of incident angles. Some experimental examples are given to show the stress measurement at low and fixed incident angle.

Abstract: The surface modification of titanium by micro-arc oxidation under different voltages was processed to achieve good direct oseointegration. The new technique of two-dimensional X-ray diffraction was used to measure the residual stress of the layer. The results show that a porous titania layer containing Ca and P is obtained by micro-arc oxidation. The pore size and Ca/P of the layer are affected by the voltage. The high voltage can induce forming CaTiO3. The residual stress under different voltage is compressive stress and increases with the improvement of the voltage.

Abstract: This paper introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in microstructure and residual stress analysis. Based on the matrix transformation between diffraction space, detector space and sample space, the unit vector of the diffraction vector can be expressed in the sample space corresponding to all the geometric parameters and Bragg conditions. The same transformation matrix can be used for texture and stress analysis. The fundamental equations for both stress measurement and texture measurement are developed with the matrix transformation defined for the two-dimensional diffraction. Stress measurement using twodimensional detector is based on a direct relationship between the stress tensor and the diffraction cone distortion. The two-dimensional detector collects texture data and background values simultaneously for multiple poles and multiple directions.