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Papers by Author: C. Dehm

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Barium, Strontium and Bismuth Contamination in CMOS Processes

Authors: H. Boubekeur, T. Mikolajick, J. Höpfner, C. Dehm, W. Pamler, J. Steiner, G. Kilian, Bernd O. Kolbesen, Anton J. Bauer, Lothar Frey, Heiner Ryssel