Papers by Author: D. Mutharasu

Abstract: 25% Zinc doped Cadmium Telluride thin films were prepared using Stacked Elemental Layer method. The structural studies were conducted by the X-Ray technique and the results were compared with standard data which confirmed the presence of mixed phases (CdTe, ZnTe and CdZnTe) in the stack annealed at 425°C. Transmittance spectra depicted the effect of Zn on the optical properties of CdTe thin film. The calculated band gaps from the transmittance spectra were lie between 1.42 and 1.51eV. Scanning Electron Microscope images elucidated the influence of Zn on surface morphology and the grain growth for CdTe thin films.

Abstract: Al thin films were prepared over different substrates at various process conditions using DC sputtering. The surface topography of all prepared films was examined using AFM technique. Very smooth, uniform and dense surface were observed for Al films coated over Glass substrates. The observed particle size was nano scale (20 -70 nm) for Glass substrates. Sputtering power showed immense effect on surface roughness with respective to Ar gas flow rate. Noticeable change on surface with large particles was observed in Copper substrates at various sputtering power and gas flow rate.