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Papers by Author: D.P. Sheppard

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Depth-Profiling of Phase Composition and Texture in Layered-Graded Al₂O₃- & Ti₃SiC₂-Based Systems Using X-Ray and Synchrotron Radiation Diffraction

Authors: It Meng Low, M. Singh, P. Manurung, E. Wren, D.P. Sheppard, M.W. Barsoum

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