Papers by Author: Domenico Caputo

Paper TitlePage

Monitoring of Defects in Thermal Oxides during Electrical Stress
Authors: Domenico Caputo, Fernanda Irrera, Fabrizio Palma
237
Analysis of Non-Uniform Contamination Profiles by Lifetime Data
Authors: Maria Luisa Polignano, Domenico Caputo, Giuseppe Pavia, F. Zanderigo
413
Bias Controlled Amorphous Si/SiC:H Photodetectors
Authors: Domenico Caputo, G. De Cesare, Fernanda Irrera, F. Lemmi, G. Masini, Fabrizio Palma, M. Tucci
943
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