Papers by Author: Frédéric Christien

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Abstract: This work deals with the study of a new aluminum brazing process, called Galluminium. This technique, consisting in using gallium as a solder, is advantageous since it enables to braze at ambient air without flux. Indeed if the gallium coating is done mechanically, it descales the alumina layer and acts as a barrier against further reoxidation. Nevertheless, liquid gallium causes a severe aluminum embrittlement since it penetrates into the aluminum grain boundaries. We will show in this paper that this phenomenon has only a little impact on the mechanical resistance of the brazed joints since the amount of deposited gallium is enough low to avoid a severe embrittlement and the heat treatment (from 200°C to 600°C during several minutes) during brazing process dissolves gallium in the bulk.
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Abstract: It was recently shown [1] that EMPA-WDS (Electron Probe MicroAnalysis by Wavelength Dispersive X-ray Spectroscopy) can be used to detect and to accurately quantify monolayer surface and grain boundary segregation. This paper presents the last developments of this application. It focuses on the measurement of sulphur grain boundary segregation in nickel on fractured surfaces. A special attention was paid to the quantification of the sulphur coverage, taking into account the non-normal incidence of the electron beam on a fracture surface. Sulphur grain boundary segregation kinetics was measured at 750°C in nickel to document the quantitative possibilities of the technique.
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Abstract: It was previously reported that fatigue life of some alloys can be dramatically reduced if the grain boundaries contain a high level of impurity segregation before fatigue tests. In this paper the susceptibility of single phase brass samples (90Cu10Zn) to this form of damage is studied. After cold drawing of as cast brass bars, fatigue samples were heat treated at 800°C during 30min to promote recrystallization and impurity segregation at grain boundary. The samples were then tested under high frequency bending fatigue test at 200°C. After cracking, fracture surfaces were studied using both scanning electron microscopy (SEM) and electron probe microanalysis (EPMA). The SEM micrographs showed that the fractures were mostly intergranular. Chemical composition of intergranular cracks surface were analyzed using EPMA at low accelerating voltage. A high concentration of sulfur was found on most of grain boundary facets. The internal stress in alloys after fatigue was qualitatively estimated using electron backscattering diffraction in scanning electron microscopy. A high level of local misorientation was found near most grain boundaries. The mechanism of intergranular cracks formation during fatigue is discussed taking into account both the segregation of sulfur at grain boundaries and accumulation of plastic strain at grain boundaries
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Abstract: Irradiation of metals leads to the formation of point-defects (vacancies and selfinterstitials) that usually agglomerate in the form of dislocation loops. Due to the elastic interaction between SIA (self-interstitial atoms) and dislocations, the loops absorb in most cases more SIA than vacancies. That is why the loops observed by transmission electron microscopy are almost always interstitial in nature. Nevertheless, vacancy loops have been observed in zirconium following electron or neutron irradiation (see for example [1]). Some authors proposed that this unexpected behavior could be accounted for by SIA diffusion anisotropy [2]. Following the approach proposed by Woo [2], the cluster dynamics model presented in [3] that describes point defect agglomeration was extended to the case where SIA diffusion is anisotropic. The model was then applied to the loop microstructure evolution of a zirconium thin foil irradiated with electrons in a high-voltage microscope. The main result is that, due to anisotropic SIA diffusion, the crystallographic orientation of the foil has considerable influence on the nature (vacancy or interstitial) of the loops that form during irradiation.
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