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Articles by author: H.E. Mahnke

• Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p483)
• Formation of a Pd Defect Complex in ZnTe and CdTe
  Published in: II-VI Compounds and Semimagnetic Semiconductors (p39)
• SEM and XRD Characterization of Ni-Hf Alloys at Low Hf Concentration
  Published in: Recent Developments in Advanced Materials and Processes (p325)
• Site Occupation Preferences in Multicomponent Semiconductors: The Cd_1-xZn_xTe Case
  Published in: Progress in Advanced Materials and Processes (p93)