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Articles by author: H. Hieslmair

• A Study of the Copper-Pair Related Centers in Silicon
  Published in: Defects in Semiconductors 19 (p467)
• Copper in Silicon: Quantitative Analysis of Internal and Proximity Gettering
  Published in: Defects in Semiconductors 19 (p461)
• Gettering of Transition Metals in Multicrystalline Silicon
  Published in: Defects in Semiconductors 18 (p1979)
• Gettering of Transition Metals in Multicrystalline Silicon for Photovoltaic Applications
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p165)
• Investigation of Microdefects in Multicrystalline Silicon for Photovoltaic Applications
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p449)
• Precipitation of Iron in FZ and CZ Silicon
  Published in: Defects in Semiconductors 19 (p449)
• Rate Limiting Mechanism of Transition Metal Gettering in Multicrystalline Silicon
  Published in: Defects in Semiconductors 19 (p1795)