HomeJ. Bollmann

Papers by Author: J. Bollmann

Paper TitlePage

Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?

Authors: Joerg Weber, J. Bollmann, S. Knack, V. Kotestki, H.E. Mahnke, E. Welter

483

The Photoluminescence of Pt-Implanted Silicon

Authors: Eduardo Alves, J. Bollmann, Manfred Deicher, M. Celeste Carmo, M.O. Henry, M.H.A. Knopf, Joaquim P. Leitão, R. Magerle, C.J. McDonagh

473

DLTS Combined with Perturbed Angular Correlation (PAC) on Radioactive ¹¹¹In Atoms in Ge

Authors: Ch. Zistl, R. Sielemann, H. Hässlein, Sven Gall, D. Bräunig, J. Bollmann

53

Electrically Active Near-Surface Implantation Defects in Silicon and GaAs

Authors: J. Bollmann, H.A. Klose

461