Articles by author: J. Schneider
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A Unique Sr-Rich K-Richterite from Siberia: Rietveld Structure Refinement
Published in: European Powder Diffraction 6 (p994) -
Application of Combined Neutron and X-Ray Powder Diffraction Refinements to the Structure of Congruent Lithium Niobate
Published in: European Powder Diffraction 3 (p631) -
Cation Short Range Order in Non-Stoichiometric NaTI
Published in: Neutron Scattering - Advances and Applications (p63) -
Charactrization of Residual Transition Metal Ions in GaN and AIN
Published in: Defects in Semiconductors 18 (p55) -
Crystal Structure of PdNiAs, Ordered Member of Isomorphous Series Pd2As-Ni2As
Published in: European Powder Diffraction 6 (p700) -
Excited Defect Energy States from Temperature Dependent ESR
Published in: Defects in Semiconductors 16 (p1171) -
Experimental Thermomechanical Processing of High Si-Steels (up to 6.5%Si)
Published in: EMMA-2000 (p773) -
GUFI-WYRIET: An Integrated PC Powder Pattern Analysis Package
Published in: European Powder Diffraction (p277) -
Integration of Intensity and Angle Calibration into Rietveld Refinement
Published in: European Powder Diffraction 4 (p35) -
Interface Structure Effects on the Fracture of Hard Thin Films
Published in: Intergranular and Interphase Boundaries in Materials (p633) -
Iron Acceptors in Gallium Nitride (GaN)
Published in: Defects in Semiconductors 17 (p93) -
Magnetic Aftereffect in Amorphous and Nonocrystalline Fe73.5Cu1Nb3Si16.5B6
Published in: Materials Science for High Technologies (p525) -
Magnetic Circular Dichroism Investigation of the Neutral and the Ionized Manganese Acceptor in GaAs
Published in: Defects in Semiconductors 15 (p797) -
Magnetic Resonance of X-Point Shallow Donors in AlSb:Te Bulk Crystals and AlSb MBE Layers
Published in: Defects in Semiconductors 16 (p793) -
Mössbauer Spectroscopy of Amorphous and Nanocrystalline Fe73.5Cu1Nb3Si16.5B6
Published in: Materials Science for High Technologies (p523)