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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Jerzy M. Langer
14 papers on 1 page:
1
Alloy Broadening of the Acceptor-Related Near-Gap Luminescence in Semiconductor Alloys
Published in:
Shallow Impurities in Semiconductors V
(p105)
Defects and Schottky Barrier Formation: A Positive Proof for Epitaxial Al on AlGaAs Schottky Diodes
Published in:
Defects in Semiconductors 16
(p1545)
DX-Like Centres in Semiconductors: Metastability, Bistability and Negative U
Published in:
Shallow Impurities in Semiconductors IV
(p433)
Environmental Effects in DX (Te) Centers in GaAlAs
Published in:
Defects in Semiconductors 14
(p399)
Ionization Energies of Rare Earth Impurities in III-V and II-VI Semiconductor Compounds
Published in:
Defects in Semiconductors 17
(p721)
Lattice Relaxation of In Donors in CdF
2
Published in:
Defects in Semiconductors 19
(p1431)
Negative-U Aspects of DX-Center in Al
x
-Ga
1-x
As
Published in:
Physics of DX Centers in GaAs Alloys
(p233)
Persistent Photoluminescence of DX-Centers in Ga
1-x
Al
x
As:Si
Published in:
Defects in Semiconductors 15
(p1131)
Photoinduced Magnetism in CdF
2
with Bistable Donors: The Clue for the Negative U?
Published in:
Defects in Semiconductors 19
(p1449)
Screening of the Coulomb Interaction and Transition Metal Energy Levels Pinning to the Semiconductor Neutrality Level
Published in:
Defects in Semiconductors 15
(p275)
Spectroscopy of GaAs and InP Grown in the Presence of Rare Earth Elements
Published in:
Defects in Semiconductors 14
(p633)
Surface Recombination in Semiconductors
Published in:
Defects in Semiconductors 18
(p1389)
Test for the Impurity Wavefunction Modelling from the Alloy Broadening of the Impurity-Related Luminescence
Published in:
Defects in Semiconductors 17
(p501)
Use of Bistable Centers in CdF
2
in Holographic Recording
Published in:
Defects in Semiconductors 18
(p1103)
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