Papers by Author: Ji Heang Yu

Abstract: Yttria stabilized zirconia (YSZ) films with the thickness of up to 12 μm were prepared on alumina and NiO-YSZ substrates by electron beam physical vapor deposition (EB-PVD). The films showed nano-scaled columnar structures depending on the substrate temperature. Electrical conductivity of the YSZ films on alumina was also investigated at the temperature between 700 and 1000oC in oxidizing atmosphere. High activation energy of the conductivity (>1.03eV) indicated that the conduction via grain boundary controlled the ionic conduction in the films prepared by EB-PVD. La0.6Sr0.4CoO3-δ as a cathode was applied on the YSZ/NiO-YSZ in order to evaluate the performance of the YSZ electrolyte.

Abstract: This paper presents the work on the development of ceramic coating processing. Nano-structured zirconia coating has been developed with functions; substrate temperature and oxygen gas change in chamber by electron beam physical vapor deposition (EB-PVD). The microstructure of the coating layer has been characterized with FE-SEM, and SEM. The crystalline phase of the coating layer has been also characterized with XRD. The zirconia coating by EB-PVD had not monoclinic zirconia phase as shown in XRD pattern and Raman spectra and the thickness of coating were quite homogeneous. The fracture microstructure of the coating layer for a thickness of ~15 μm showed columnar or non-columnar structure and had nano-structure with nano scaled grain as shown in micrograph by FE-SEM.