Articles by author: Joerg Weber
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A Fast Diffusing Species in Silicon Crystals
Published in: Defects in Semiconductors 15 (p741) -
Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?
Published in: Gettering and Defect Engineering in Semiconductor Technology X (p483) -
Correlation of Structural and Electronic Properties from Dislocations in Semiconductors
Published in: Polycrystalline Semiconductors III (p13) -
Correlation of the D-Band Photoluminescence with Spatial Properties of Dislocations in Silicon
Published in: Defects in Semiconductors 16 (p1315) -
Diffusion and Drift of Hydrogen in Si and GaAs
Published in: Defects in Semiconductors 16 (p21) -
Dislocation-Induced Defect Levels in Silicon
Published in: Defects in Semiconductors 17 (p1571) -
EL2 Induced Enhancement of the Donor Acceptor Pair Luminescence in GaAs
Published in: Defects in Semiconductors 19 (p1009) -
Electrically Active Silver-Hydrogen Complexes in Silicon
Published in: Defects in Semiconductors 19 (p301) -
Evidence for an Inhomogeneous Distribution of Thermal Donors in Silicon from Electrical and Optical Measurements
Published in: Defects in Semiconductors 14 (p979) -
Formation and Structure of Hydrogen Molecules in Crystalline Si
Published in: Defects in Semiconductors 19 (p241) -
Hydrogen Induced Defects in Cobalt Doped Silicon
Published in: Defects in Semiconductors 18 (p927) -
Hydrogen-Induced Isotope Shift of Dipole Transitions of Shallow Donors in Silicon
Published in: Shallow Impurities in Semiconductors V (p135) -
Identification of Microdefects Induced in Si after Hydrogen and Helium Plasma Treatments
Published in: Defects in Semiconductors 15 (p1033) -
Infrared Absorption Lines in Hydrogen-Plasma Treated Se-Doped GaAs
Published in: Shallow Impurities in Semiconductors V (p309) -
Interaction of a Copper-Induced Defect with Shallow Acceptors and Deep Centers in Silicon
Published in: Defects in Semiconductors 16 (p167)