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Articles by author: Klaus Pressel

• An Optical Zeeman Study on Fe³⁺ in GaAs and InP
  Published in: Defects in Semiconductors 17 (p797)
• FTIR High Resolution Optical Study of GaAs:Fe
  Published in: Defects in Semiconductors 16 (p695)
• Ni Related Centers in Synthetic Diamond
  Published in: Defects in Semiconductors 18 (p79)
• On the Incorporation of Carbon In SiO₂ Layers
  Published in: Surface Diffusion and Surface Structure (p1)
• Optical Investigation of Ge-Rich Ge_1-xSi_x (0≤ x ≤ 0.1) Alloys
  Published in: Defects in Semiconductors 19 (p109)
• Photoluminescence Uniaxial Stress Study of Fe₂+ in InP
  Published in: Defects in Semiconductors 15 (p869)
• Shallow Bound Pseudoacceptor States of Iron in Gallium Phosphide
  Published in: Defects in Semiconductors 17 (p791)
• Zeeman Spectroscopy of Transition Metals in Hexagonal GaN
  Published in: Defects in Semiconductors 18 (p719)
• Zeeman Study of the 0.9 eV Emission in AlN and GaN
  Published in: Defects in Semiconductors 19 (p1131)