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Articles by author: Koji Sumino

• <100> and<111> Configurations of Iron-Acceptor Pairs in Silicon Related to Stable and Metastable States
  Published in: Defects in Semiconductors 16 (p155)
• A Positron Lifetime Study of Defects in Plastically Deformed Silicon
  Published in: Defects in Semiconductors 18 (p1177)
• Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement
  Published in: Positron Annihilation - ICPA-10 (p423)
• Cathodoluminescence Study on Dislocation-Related Luminescence in Silicon
  Published in: Defects in Semiconductors 18 (p1201)
• Current Problems of Defects in Semiconductors – Interaction of Defects with Impurities
  Published in: Positron Annihilation - ICPA-9 (p139)
• Defect Reactions in Semiconductors
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p197)
• Deformation-Induced Vacancy Clusters in InP Studied by Positron Annihilation
  Published in: Positron Annihilation - ICPA-9 (p1061)
• Dislocation Activities in Bulk GeSi Crystals
  Published in: Defects in Semiconductors 19 (p159)
• Effect of Impurities on Dislocation Activity in GaAs
  Published in: Defects in Semiconductors 15 (p1385)
• Effect of Transition Metal Impurities on the Photoluminescence of Deformed Si Crystal
  Published in: Defects in Semiconductors 18 (p1213)
• Electrical Transport in Si_xGe_1-x Bulk Alloys
  Published in: Defects in Semiconductors 18 (p353)
• Electronic States Associated with Straight Dislocations in P-Type SiliconStudied by Means of Electric-Dipole Spin Resonance
  Published in: Defects in Semiconductors 18 (p1189)
• Energy States of Deformation-Induced Dislocations in Silicon Crystals
  Published in: Defects in Semiconductors 18 (p1195)
• Formation of Hydrogen-Oxygen-Vacancy Complexes in Silicon
  Published in: Defects in Semiconductors 18 (p939)
• Generation Process of EL2 Centers in GaAs
  Published in: Defects in Semiconductors 15 (p129)