Papers by Author: L.J. Geerligs

Abstract: This paper investigates the impact of iron (Fe) and molybdenum (Mo) when they are introduced in the feedstock for mono- and multicrystalline Float-Zone (FZ) silicon (Si) growth. Neutron Activation Analysis shows that the segregation coefficient is in agreement with literature values. Lifetime maps on monocrystalline wafers show a uniform lifetime which decreases with the increase of contamination levels. Multicrystalline wafers show low lifetime areas, corresponding to grain boundaries and highly dislocated areas, which are independent from the contamination levels. Intra grain areas have a higher lifetime which changes with the contamination levels. The solar cells show a reduced diffusion length in multicrystalline uncontaminated cells compare to the monocrystalline uncontaminated. In multicrystalline cells the lowest level of Fe introduced (1012 atm/cm3) has hardly any influence, whereas in the Mo-contaminated cells the impact is visible from the lowest level (1011 atm/cm3). In monocrystalline cells the diffusion length is reduced already at the lowest contamination level of Fe.

Abstract: Changes in the concentration of interstitial iron in multicrystalline silicon wafers after high temperature annealing (900°C) have been monitored by carrier lifetime measurements. Two cooling rates were investigated. The first was considered ‘fast’, meaning the interstitial Fe had no time to diffuse to precipitation sites, and should therefore be frozen-in, despite being far above the solubility limit at lower temperatures. A second ‘slow’ cool down to 650°C allowed ample time for the Fe to reach the surfaces or other internal precipitation sites. Surprisingly, in both cases the Fe remained in a supersaturated state. This indicates the precipitation process is not diffusion-limited, and that another energetic barrier to precipitate formation must be present. Since the slow cooling used here is similar to the cooling rate experienced by multicrystalline ingots after crystallisation, this precipitate-impeding mechanism is probably responsible for the surprisingly high interstitial Fe concentrations often found in as-grown multicrystalline silicon wafers.