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Papers by Author: O. Sicardy

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X-Ray Diffraction Determination of Residual Stresses in Narrow Copper Interconnects with Submicronic Widths

Authors: O. Sicardy, I. Touet, L. Arnaud, F. Charlet, T. Berger

562

Determination of Zircaloy -4 Radiocristallographic Elastic Constants from Room Temperature to 300°C

Authors: L. Gosmain, Christophe Valot, M. Lallemant, D. Ciosmak, O. Sicardy

48