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Articles by author: P. Omling

• Electron Paramagnetic Resonance Studies of Defects in Indium-Doped Silicon
  Published in: Defects in Semiconductors 15 (p445)
• EPR Identification of Mn- or Cr-Acceptor Pairs in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p215)
• Excitation Spectrum of the Interstitial Iron Donor in Silicon
  Published in: Defects in Semiconductors 15 (p397)
• Formation and Defect Structure of FeIn Pairs in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p207)
• ODMR Investigations of A - Centres in CdTe
  Published in: Defects in Semiconductors 16 (p1235)
• Optical and Spin Dependent Investigations of Mn²⁺ and V³⁺ in GaP
  Published in: Defects in Semiconductors 16 (p713)
• PHOTO-EDSR in Plastically Deformed p-Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p583)
• Photoluminescence and Optically Detected Magnetic Resonance Investigations on the Indium A-Center in CdTe:In
  Published in: Defects in Semiconductors 17 (p399)
• The Energy Position of the EL2 Ground State in GaAs
  Published in: Defects in Semiconductors 14 (p329)
• The Identification of Intrinsic Vacancy Defects in CdTe
  Published in: Defects in Semiconductors 17 (p397)
• The Influence of Process-Induced Surface Defects on Luminescence and Transport Properties of Low-Dimensional Structures
  Published in: Defects in Semiconductors 17 (p1541)
• The Temperature Dependence of the Hole Ionization Cross Section of EL2 in GaAs
  Published in: Defects in Semiconductors 15 (p79)
• Transition-Metal Acceptor Pairs in Silicon
  Published in: Defects in Semiconductors 16 (p137)