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Articles by author: R. Scholz

• Determination of Creep Damage in the ODS Superalloy MA6000
  Published in: Advances in Engineering Materials (p135)
• Diffusion in GaAs and Related Compounds: Recent Developments
  Published in: Diffusion in Materials DIMAT 1996 (p1079)
• Formation and Prevention of Micropipes and Voids in CVD Carbonization Experiments on (100) Silicon
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p219)
• HREM and DLTS of Σ37(610) and Σ29(520 )[001] Tilt Grain Boundaries in Ge Bicrystals
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p565)
• Interdiffusion in GaAs/GaAsP and GaAs/GaAsSb Superlattices
  Published in: Diffusion in Materials DIMAT 1996 (p1101)
• New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p553)
• Optical Properties of PTCDA Bulk Crystals and Ultrathin Films
  Published in: Recent Developments in Advanced Materials and Processes (p41)
• Size-Controlled Si Nanocrystals for Photonic and Electronic Applications
  Published in: Interfacial Effects and Novel Properties of Nanomaterials (p95)