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Papers by Author: S. Brennan

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Investigation of Trace Metals Analyses of Dry Residue on Silicon Wafer Surfaces by TXRF and ICP-MS

Authors: Jiang Bo Wang, M. Balazs, Piero Pianetta, K. Baur, S. Brennan

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X-Ray Synchrotron Radiation Structural Studies of Amorphous Materials

Authors: A. Bienenstock, S. Brennan, A. Fischer-Colbrie, P.H. Fuoss, K.F. Ludwig, R.D. Lorentz, W.K. Warburton, L. Wilson

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