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Papers by Author: S. Hopfe

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TEM Investigations on the Structure and Stability of Diffusion Barriers for VLSI Contacts

Authors: S. Hopfe, Manfred Reiche

611

Investigations of the Behaviour of Transition Metals in Silicon

Authors: W. Nitzsche, O. Brodersen, S. Hopfe, Manfred Reiche, I. Burck

49