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Articles by author: S. Takeda

• Calculation of the Atomic and Electronic Structure of the {113} Planar Interstitial Defects in Silicon
  Published in: Polycrystalline Semiconductors III (p163)
• Clustering Process of Point Defects in GaP Studied by Transmission Electron Microscopy
  Published in: Defects in Semiconductors 18 (p1279)
• Electron Irradiation Effects in Silicon Thin Foils Under Ultra-High Vacuum Environment
  Published in: Defects in Semiconductors 19 (p553)
• Formation of Extended Defects in Polycrystalline SiGe by Electron Irradiation
  Published in: Polycrystalline Semiconductors VII (p361)
• Heat Resistance of Mg-Zn-Al-Ca Alloy Castings
  Published in: Magnesium Alloys 2000 (p73)
• High Resolution EELS Study of Extended Defects in Silicon
  Published in: Defects in Semiconductors 19 (p547)
• Modeling of Self-Interstitial Clusters and their Formation Mechanism in Si
  Published in: Defects in Semiconductors 19 (p535)
• Structural Study of Hydrogen Induced Platelet in Si and Ge by Transmission Electron Microscopy
  Published in: Defects in Semiconductors 17 (p897)