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Articles by author: T. Shigematsu

• Growth Parameters Determining the Type of Grown-In Defects in Czockralski Silicon Crystals
  Published in: Defects in Semiconductors 18 (p1713)
• Martensitic Phase Transitions in ZrO₂-Y₂O₃ Thin Films Produced by RF Co-Sputtering Method
  Published in: Martensitic Transformations (p377)
• Structural Studies on BICOVOX
  Published in: Systems with Fast Ionic Transport - IV (p75)